Multi-Wavelength Ellipsometers for Thin Film Measurements
The Film Sense FS‑1™ Multi-Wavelength Ellipsometer uses long-life LED’s and a no-moving-parts ellipsometric detector to provide fast and reliable thin film measurements in an easy-to-use, compact system.
The film thickness of most transparent thin films from 0 – 1000 nm can be determined with excellent precision and accuracy by a simple 1 second measurement. Optical constants n & k and other film properties can also be measured for many samples.
The FS‑1 offers the power of Multi-Wavelength Ellipsometry, but at the price point of single wavelength ellipsometer and spectroscopic reflectometer systems. The FS‑1 is ideal for measurements in the research lab, classroom, in situ process chambers, industrial quality control, and more.
Contact us to discuss if the FS‑1 is right for your thin film application.